Nova i570® HP

Highest performance IM solution

Nova i570® HP

Nova i570® HP is Nova’s most advanced integrated metrology platform and the leading member of the Nova i570® product family. Nova i570® HP provides the highest metrology performance, process control and productivity capabilities for the most advanced logic and memory process nodes

Highlights and Benefits

Highest Throughput

Superior Variation Control

Highest Accuracy

Compatible with Nova i550®

Highest Throughput

Superior Variation Control

Highest Accuracy

Compatible with Nova i550®

Highest Throughput

Brings significant improvement in wafers per hour to increase customer sampling, and attaches to the industry’s fastest CMP polishers

Superior Variation Control

Enables control of every wafer, and measures within-wafer and within-die information

Highest Accuracy

Demonstrates higher accuracy compared to previous generations, and offers best-in-class precision and tool-to-tool performance for leading-edge technology nodes

Compatible with Nova i550®

Fully backward compatible with the Nova i550® platform

wafers-4

Why Nova i570® HP?
Embodying Nova’s mission as the integrated metrology market leader, Nova i570® HP is the company’s top-performing solution for R&D and high-volume manufacturing fabs.

The next generation of the successful Nova i550®, Nova i570® HP offers extensive spectral information, smallest pad size, and cutting-edge pattern recognition.

Supporting the newest and fastest CMP polishers, Nova i570® HP delivers the market’s highest throughput. The solution enables both enhanced within-wafer/within-die variation control by measuring more sites and pre- and post-wafer measurements. Equipped with Nova’s advanced modeling and algorithmic software solutions, Nova i570® HP significantly improves metrology accuracy, precision and tool matching capabilities. 

When supported by Nova’s central fleet management, control and connectivity suite, Nova i570® HP offers even greater operational efficiency and advanced metrology control functionality.

What is Nova i570® HP?

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Press Releases

Nova Introduces Unique Portfolio to Address Next-Generation Logic Fabrication Challenges

Nova Introduces Unique Portfolio to Address Next-Generation Logic Fabrication Challenges

17 Feb, 2022
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IBM Research and Nova Jointly Awarded the “Best Metrology Paper” at SPIE Advanced Lithography Conference

IBM Research and Nova Jointly Awarded the “Best Metrology Paper” at SPIE Advanced Lithography Conference

26 Apr, 2022
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