U.S. TOLL-FREE: 1-833-816-1427
ISRAEL TOLL-FREE: 1-80-9213284
INTERNATIONAL: 1-412-317-0519
WEBCAST LINK: https://event.choruscall.com/mediaframe/webcast.html?webcastid=iPbrhsJX
At:
8:30 a.m. Eastern Time
5:30 a.m. Pacific Time
The conference call will also be available via a live webcast from a link on Nova’s Investor Relations website – https://www.novami.com/investors/events/. A replay of the conference call will be available from February 13, 2025, to February 20, 2025. To access the replay, please dial one of the following numbers:
Replay TOLL-FREE: 1-877-344-7529
Replay TOLL/INTERNATIONAL: 1-412-317-0088
Replay Pin Number: 8533745
Join us in SPIE, 23 – 27 February 2025, in San Jose, California, US.
Short Course: Scatterometry in Profile, Overlay and Focus Process Control
Hugo Cramer – ASML Netherlands B.V. (Netherlands) and Igor Turovets – Nova Ltd. (Israel)
Course SC1100
23 February 2025, 1:30 PM – 5:30 PM PST
Mark your calendars to assure that you join our partner’s lecture:
Critical In-Line OCD Metrology for CFET Manufacturing (13426-4)
Hyukyun Kwon, imec (Belgium)
Conference 13426: Metrology, Inspection, and Process Control | Session 2: Optical Metrology
24 February, 1:40 PM PST | Convention Center, Grand Ballroom 220B
Metrology-design co-optimization for BEOL dimensional characterization using scatterometry (13426-33)
Stefan Schoeche, IBM, Thomas J. Watson Research Ctr. (United States)
Conference 13426: Metrology, Inspection, and Process Control | Session 7: 3D Profile and Shape Metrology
26 February, 9:30 AM PST | Convention Center, Grand Ballroom 220B
Scatterometry-informed machine learning study to determine bi-directional intercorrelation of adjacent patterning steps (13426-46)
Padraig R. Timoney, IBM, Thomas J. Watson Research Ctr. (United States)
Conference 13426: Metrology, Inspection, and Process Control | Session 10: Metrology for Advanced Logic
26 February, 4:30 PM PST | Convention Center, Grand Ballroom 220B
Challenges and responses of metrology technologies for the new wave of 3d NAND devices (13426-57)
Dongchul Ihm, Samsung Electronics Co Ltd (Korea)
Conference 13426: Metrology, Inspection, and Process Control | Session 12: Heterogeneous Integration and Advanced Packaging
27 February, 11:30 AM PST | Convention Center, Grand Ballroom 220B
Join Us in SEMICON China
Shanghai New International Expo Center
March 26-28, 2025 | Hall N4 | Booth #4609
Meet Guy Kizner, Nova’s CFO at 2025 Chicago Tech Summit in Chicago, USA.
Join Guy Kizner, Nova’s CFO in Cantor Fitzgerald Global Technology Conference, March 11th 2025 in New York
Presentation at 8:40 am ET.
Click Here to Join the Webcast- Link: https://sqps.onstreamsecure.com/origin/enliven/players/EnlivenPlayer.html?customerId=22&eventId=74836273&checkCompany=1&checkEmail=1&checkName=1 [sqps.onstreamsecure.com]
Join Gaby Waisman- President and CEO, Eitan Oppenhaim- Chairman of the Board, Guy Kizner, CFO in New York at the 27th Annual Needham Growth Conference Click to join the webcast: https://wsw.com/webcast/needham143/register.aspx?conf=needham143&page=nvmi&url=https://wsw.com/webcast/needham143/nvmi/2269828
Visit us in SEMICON Korea, COEX, Seoul, February 19-21, 2025 | Hall C | 3rd floor | Booth #400
Mark your calendars and make sure to join our experts in the following lectures:
Metrology & Inspection Forum
The Next Wave of Convergence: Panel-Level Packaging and Co-Packaged Optics
Presented by: Sang Hyun Han, VP Strategic Marketing
Room #402, 4th Floor, Conference Room (South) , COEX
February 20 | 11:30-12:00
CMP & Cleaning Technology
Cutting-Edge Integrated Metrology Solutions for Emerging CMP Challenges
Presented by: Nurit Taub, Product Marketing Manager
Room #308, 3rd Floor, Conference Room (South), COEX
February 20 | 13:25-13:50
Join Nova’s CFO, Guy Kizner at the UBS Global Technology and AI Conference in Arizona, on December 3rd
Meet us at SEMICON Japan, at Tokyo Big Sight, Tokyo, Japan
December 11-13, 2024 | Hall 6 | Booth #6330
Meet us at SEMICON EUROPA, at the MESSE MÜNCHEN, Munich, Germany
November 12–15, 2024 | Hall C2 | Booth #2519