Join Dr. Andreas Möller for an eye opening lecture about: Embracing Sustainability in Metrology: From Holistic Measurement to Non-Reagent Techniques
Join Guy Kizner, Nova’s CFO at BofA 2025 Global Tech Conference, for a fireside chat and one on one meetings, June 3rd 2025.
Join Guy Kizner, Nova’s CFO on Citi’s 2025 Macro & Pan-Asia Investor Conference Virtual Event, May 28th 2025.
Join Guy Kizner, Nova’s CFO, in Citi’s 2025 Taiwan Tech Conference, May 21st, 2025.
Join Guy Kizner, Nova’s Chief Financial Officer for Virtual one-on-one meetings.
Friday, February 28
Join Guy Kizner, Nova’s Chief Financial Officer, for in person meetings.
Wednesday, February 26, 2025, London, UK
U.S. TOLL-FREE: 1-833-816-1427
ISRAEL TOLL-FREE: 1-80-9213284
INTERNATIONAL: 1-412-317-0519
WEBCAST LINK: https://event.choruscall.com/mediaframe/webcast.html?webcastid=iPbrhsJX
At:
8:30 a.m. Eastern Time
5:30 a.m. Pacific Time
The conference call will also be available via a live webcast from a link on Nova’s Investor Relations website – https://novami.com/investors/events/. A replay of the conference call will be available from February 13, 2025, to February 20, 2025. To access the replay, please dial one of the following numbers:
Replay TOLL-FREE: 1-877-344-7529
Replay TOLL/INTERNATIONAL: 1-412-317-0088
Replay Pin Number: 8533745
Join us in SPIE, 23 – 27 February 2025, in San Jose, California, US.
Short Course: Scatterometry in Profile, Overlay and Focus Process Control
Hugo Cramer – ASML Netherlands B.V. (Netherlands) and Igor Turovets – Nova Ltd. (Israel)
Course SC1100
23 February 2025, 1:30 PM – 5:30 PM PST
Mark your calendars to assure that you join our partner’s lecture:
Critical In-Line OCD Metrology for CFET Manufacturing (13426-4)
Hyukyun Kwon, imec (Belgium)
Conference 13426: Metrology, Inspection, and Process Control | Session 2: Optical Metrology
24 February, 1:40 PM PST | Convention Center, Grand Ballroom 220B
Metrology-design co-optimization for BEOL dimensional characterization using scatterometry (13426-33)
Stefan Schoeche, IBM, Thomas J. Watson Research Ctr. (United States)
Conference 13426: Metrology, Inspection, and Process Control | Session 7: 3D Profile and Shape Metrology
26 February, 9:30 AM PST | Convention Center, Grand Ballroom 220B
Scatterometry-informed machine learning study to determine bi-directional intercorrelation of adjacent patterning steps (13426-46)
Padraig R. Timoney, IBM, Thomas J. Watson Research Ctr. (United States)
Conference 13426: Metrology, Inspection, and Process Control | Session 10: Metrology for Advanced Logic
26 February, 4:30 PM PST | Convention Center, Grand Ballroom 220B
Challenges and responses of metrology technologies for the new wave of 3d NAND devices (13426-57)
Dongchul Ihm, Samsung Electronics Co Ltd (Korea)
Conference 13426: Metrology, Inspection, and Process Control | Session 12: Heterogeneous Integration and Advanced Packaging
27 February, 11:30 AM PST | Convention Center, Grand Ballroom 220B
Join Us in SEMICON China
Shanghai New International Expo Center
March 26-28, 2025 | Hall N4 | Booth #4609
Meet Guy Kizner, Nova’s CFO at 2025 Chicago Tech Summit in Chicago, USA.